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Characterization of silicon carbide and silicon powders by XPS and zeta potential measurement

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Journal of Materials Science Letters

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Correspondence to Y. Zhang.

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Binner, J., Zhang, Y. Characterization of silicon carbide and silicon powders by XPS and zeta potential measurement. Journal of Materials Science Letters 20, 123–126 (2001). https://doi.org/10.1023/A:1006734100499

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