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Characteristics of thick-film resistors, fired under dielectric layer

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Journal of Materials Science Letters

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References

  1. S. J. HOROWITZ, in Proc. 9th International Microelectronics Conf., Omiya, Japan, April 1996, p. 214.

  2. J. POWELL, B. DURWOOD and P. RUTTENCUTTER, in Proc. International Conference and Exhibition on Multichip Modules and High Density Packaging, Denver, Colorado, April 1998, p. 165.

  3. D. K. BENDER and A. M. FERREIRA, in Proc. Int. Symp. on Microelectronics ISHM-93, Dallas, Texas, November 1993, p. 494.

  4. Du Pont data sheets, QM System, A silver based system for low cost multilayers, Du Pont Electronics, H-34375 (2.5 M) 5.91.

  5. C. R. S. NEEDS, in Proc. Int. Symp. Microelectronics ISHM-94, Boston, 1994, p. 173.

  6. H. KANDA, R. C. MASON, C. OKABE, J. D. SMITH and R. VELASQUEZ, in Proc. Int. Symp. on Microelectronics ISHM'95, Los Angeles, 1995, p. 47.

  7. R. C. MASON and P. J. BOLTON, in Proc. Int. Symp. on Microelectronics IMAPS-1998, San Diego, 1998, p. 467.

  8. S. SCRANTOM, G. GRAVIER, T. VALENTINE, D. PEHLKE and B. SCHIFFER, in Proc. Int. Symp. on Microelectronics IMAPS-1998, San Diego, 1998, p. 459.

  9. R. J. BOUCHARD, and L. J. GILLSON, Mater. Res. Bull. 6(8) (1971) 669.

    Google Scholar 

  10. M. A. SUBRAMANIAN, G. ARAVAMUDAN and G. V. S. RAO, Progress Solid State Chem. 24 (1981) 55.

    Google Scholar 

  11. B. MORTEN, A. MASOERO, M. PRUDENZIATI and T. MANFREDINI, J. Phys. D: Appl. Phys. 27(10) (1994) 2227.

    Google Scholar 

  12. W. A. CRAIG, C. R. PICKERING, M. F. BARKER and J. COCKER, in Proc. 8th European Hybrid Microelectronics Conf. ISHM Europe 91, Rotterdam, 1991, p. 188.

  13. T. V. NORDSTROM and C. R. HILLS, Microstructural studies of thick film resistors using transmission electron microscopy, in Proc. Int. Hybrid Microelectronics Symp. ISHM-79, Los Angeles, 1979, p. 40.

  14. J. V. BIGGERS, J. R. MCKELVY and W. A. SCHILZE, J. Am. Ceram. Soc. 65(1) (1982) C-13.

    Google Scholar 

  15. A. KUBOVY, A percolation model of the conduction threshold in thick film resistors: segregated structures, J. Phys. D: Appl. Phys. 19 (1986) 2127.

    Google Scholar 

  16. M. HROVAT, Z. SAMARDŽIJA, J. HOLC and D. BELAVIČIJA, J. Mater. Sci.; Materials in Electronics, to be published.

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Hrovat, M., Belavič, D., Samardžija, Z. et al. Characteristics of thick-film resistors, fired under dielectric layer. Journal of Materials Science Letters 19, 1551–1555 (2000). https://doi.org/10.1023/A:1006725106255

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