Abstract
By employing neutron (or X-ray) diffraction, the structure of crystalline materials can be determined. However, if an impurity in the crystal is present in concentrations below, say, 1·10−4, its influence cannot be observed in the diffraction patterns. If the impurity present at low concentrations is to be localized, a signal uniquely attributable to the impurity must be obtained. In this paper, two such methods, based on the same principles as the "X-ray standing wave" technique, are proposed for neutrons.
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Blaauw, M. The Feasibility of Combined NAA and Neutron Diffraction. Journal of Radioanalytical and Nuclear Chemistry 244, 425–428 (2000). https://doi.org/10.1023/A:1006712431467
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DOI: https://doi.org/10.1023/A:1006712431467