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Mn K-Edge X-Ray Absorption Spectroscopic Study of Mn-Doped Zn2SiO4 Phosphors

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Telecommunication Basic Research Laboratory, Electronics and Telecommunications Research Institute, Taejon, 305–350, Korea

    Y. G. Choi & K. H. Kim

  2. Advanced Materials Division, Korea Research Institute of Chemical Technology, Taejon, 305–343, Korea

    K. S. Sohn & H. D. Park

  3. Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang, Kyungbuk, 790–784, Korea

    J. M. Lee

Authors
  1. Y. G. Choi
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  2. K. H. Kim
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  3. K. S. Sohn
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  4. H. D. Park
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  5. J. M. Lee
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Choi, Y.G., Kim, K.H., Sohn, K.S. et al. Mn K-Edge X-Ray Absorption Spectroscopic Study of Mn-Doped Zn2SiO4 Phosphors. Journal of Materials Science Letters 18, 621–624 (1999). https://doi.org/10.1023/A:1006698918579

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