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Dielectric Spectroscopy of Nanoparticulate Semiconductors in Thin Films

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Strider Research Corporation, Rochester, NY, 14610-2246, USA

    J. Texter

  2. Manufacturing Research and Engineering, Eastman Kodak Company, Rochester, NY, 14650, USA

    M. Lelental

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  1. J. Texter
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  2. M. Lelental
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Texter, J., Lelental, M. Dielectric Spectroscopy of Nanoparticulate Semiconductors in Thin Films. Journal of Materials Science Letters 18, 775–778 (1999). https://doi.org/10.1023/A:1006680815236

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