Abstract
We have measured the temperature dependence of resistivity in relatively thick Nb/Al bilayers fabricated at room temperature, observing the decrease of ρ for increasing T typical of Anderson localization in disordered systems. We report the experimental conditions which determine this behavior and compare it to theoretical models for localization in 3D systems.
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Greco, M., Lacquaniti, V., Maggi, S. et al. Anderson Localization in Nb/Al Superconducting Bilayers. Journal of Low Temperature Physics 118, 75–89 (2000). https://doi.org/10.1023/A:1004678503644
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DOI: https://doi.org/10.1023/A:1004678503644