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The microstructural characterization of in situ grown Si3N4 whisker-reinforced barium aluminum silicate ceramic matrix composite

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Abstract

The microstructure of Barium Aluminum Silicate (BAS)/Silicon Nitride in situ whisker reinforced ceramic matrix composite was examined by X-ray diffraction, transmission electron microscopy, electron diffraction and energy-dispersive X-ray microanalysis. Although we cannot conclusively exclude the presence of orthorhombic BAS, hexagonal BAS and both α-Si3N4 and β-Si3N4 were identified in this material. The crystallization process of the glass phase can be taken almost to completion but a small proportion of residual glass phase is present. Both whiskerlike and equiaxed β-Si3N4 exist in this material.

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Authors and Affiliations

  1. Department of Mechanical Engineering, University of Houston, Houston, Texas, 77204-4792

    F. Yu, C. R. Ortiz-Longo & K. W. White

  2. Loral Vought Systems, Corp., P. O. Box 650003, Dallas, TX, 75265-0003

    David L. Hunn

Authors
  1. F. Yu
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  2. C. R. Ortiz-Longo
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  3. K. W. White
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  4. David L. Hunn
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Yu, F., Ortiz-Longo, C.R., White, K.W. et al. The microstructural characterization of in situ grown Si3N4 whisker-reinforced barium aluminum silicate ceramic matrix composite. Journal of Materials Science 34, 2821–2835 (1999). https://doi.org/10.1023/A:1004623015929

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