Abstract
Microhardness measurements of homogeneous and layered polymorphous PbSe films as well of the KCl and BaF2 substrates on which the films were deposited were undertaken. The interpretation of the experimental results lead to a formula describing more adequately the indentation size effect. It is also shown that an extremum in the microhardness depth profile appears whenever the indentor crosses an interface.
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Baleva, M., Mateeva, E. & Trifonova, E.P. Distribution of the crystal modifications in polymorphous PbSe films revealed by microhardness measurements. Journal of Materials Science 34, 795–799 (1999). https://doi.org/10.1023/A:1004529115175
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DOI: https://doi.org/10.1023/A:1004529115175