Abstract
Interfacial reactions of Pd and Pd/Si films on [0 0 1]-oriented GaAs substrates have been studied by X-ray photoelectron spectroscopy. In the as-deposited Pd/GaAs system, Pd interacts with Ga and the As is isolated. A Pd–Ga–As compound is observed to form under the Pd–Ga and As layers. Annealing the Pd/GaAs system at 450°C leads to the formation of islands composed of Pd–Ga and Pd–As, amongst which a Pd–Ga–As compound forms. In the Pd/Si/GaAs system, Pd diffuses in to the GaAs substrate, the Pd–Ga and Pd–Ga–As compounds are formed. In the 450°C-annealed Pd/Si/GaAs system, little interfacial reaction at the GaAs substrate occurs. Possible interfacial reactions in the Pd/GaAs and Pd/Si/GaAs systems, including the previously investigated Pt/GaAs, Pt/Si/GaAs, Ni/GaAs and Ni/Si/GaAs systems are considered by calculation of the change in enthalpy of the reactions. The thermodynamic analyses agree with the experimental results.
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Iwakuro, H., Kuroda, T., Shen, D.H. et al. Interactions of thin films of Pd and Pd/Si on GaAs: an X-ray photoelectron spectroscopic study combined with a thermodynamic analysis. Journal of Materials Science 33, 379–384 (1998). https://doi.org/10.1023/A:1004371813683
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DOI: https://doi.org/10.1023/A:1004371813683