Abstract
It is found that the films of n +-type porous silicon of low (10–50%) porosity exhibit photoluminescence in the region 400–500 nm after a 5-month storage in an air atmosphere. The spectrum of blue photoluminescence of the least porous but strongly oxidized films has maxima at 417, 435, and 465 nm. The same spectrum structure manifests itself upon the introduction of an Er3+- and Yb3+-containing complex. The mechanisms of blue photoluminesence are discussed.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
REFERENCES
A. V. Andrianov, D. I. Kovalev, V. B. Shuman, and I. D. Yaroshetskii, Pis'ma Zh. Éksp. Teor. Fiz., 56, 239–240 (1992).
A. I. Kontkievicz, A. M. Kontkievicz, J. Siejka, et al., Appl. Phys. Lett., 65, 1436–1439 (1994).
L. Tsybeskov, Ju. V. Vandyshev, and P. M. Fauchet, Phys. Rev., B49, 7821–7824 (1994).
X. Zhao, O. Shoenfeld, J. Kusano, Y. Aoyagi, and T. Sugano, Jpn. J. Appl. Phys. Lett., 71, 107 (1997).
H. Tamura, M. Ruckaschloss, T. Wirschem, and S. Veprek, Appl. Phys. Lett., 65, 1537–1540 (1994).
F. Koch, Mater. Res. Soc. Symp. Proc., 298, 319–329 (1993).
S. L. Zhang, F. M. Huang, K. S. Ho, et al., Phys. Rev., B51, 11194–11197 (1995).
W. Skorupa, R. A. Yankov, and I. E. Tischenko, Appl. Phys. Lett., 68, 2410–2412 (1996).
L. Rebohle, J. von Borany, R. A. Yankov, et al., Appl. Phys. Lett., 71, 2809–2811 (1997).
V. V. Filippov, P. P. Pershukevich, V. P. Bondarenko, and A. M. Dorofeev, Phys. Status Solidi (b), 184, 573–580 (1994).
V. P. Bondarenko, A. M. Dorofeev, V. V. Filippov, V. A. Labunov, and P. P. Pershukevich, Phys. Status Solidi (b), 179, K53–K56 (1993).
M. V. Volkin, J. Jorne, P. M. Faucher, G. Allan, and C. Delerue, Phys. Rev. Lett., 82, 197–200 (1999).
H. Koyama, N. Shima, and N. Koshida, Phys. Rev., B53, 13291–13295 (1996).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Filippov, V.V., Pershukevich, P.P., Kuznetsova, V.V. et al. Blue Photoluminescence of Oxidized Films of Porous Silicon. Journal of Applied Spectroscopy 67, 852–856 (2000). https://doi.org/10.1023/A:1004163700281
Issue Date:
DOI: https://doi.org/10.1023/A:1004163700281