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X-ray diffraction study of langasite film grown by liquid phase epitaxy

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Journal of Materials Science Letters

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Authors and Affiliations

  1. ATL/ES, Northrop Grumman Corporation, 1212 Winterson Road-, MS 3B10, Linthicum, MD, 21090, USA

    Hong Zhang, N. B. Singh, J. D. Adam & A. Berghmans

  2. AMSRL-SE-RE, 2800 Powder Mill Road, Adelphi, MD, 20783, USA

    S. Tidrow & C. Fazi

Authors
  1. Hong Zhang
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  2. N. B. Singh
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  3. J. D. Adam
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  4. A. Berghmans
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  5. S. Tidrow
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  6. C. Fazi
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Zhang, H., Singh, N.B., Adam, J.D. et al. X-ray diffraction study of langasite film grown by liquid phase epitaxy. Journal of Materials Science Letters 22, 1621–1622 (2003). https://doi.org/10.1023/A:1026301011788

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  • DOI: https://doi.org/10.1023/A:1026301011788

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