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Correction for Background and Sensitivity Threshold in Quantitative X-Ray Phase Analysis

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Abstract

A procedure was proposed for the simultaneous correction of the background and sensitivity thresholds of the phases to be determined. The procedure provides the estimation of the minimum concentrations of phases in mixtures that can be detected by an X-ray diffraction technique.

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REFERENCES

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Authors and Affiliations

  1. Institute of Solid-State Chemistry, Ural Division, Russian Academy of Sciences, ul. Pervomaiskaya 91, Yekaterinburg, 620219, Russia

    B. G. Golovkin

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  1. B. G. Golovkin
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Golovkin, B.G. Correction for Background and Sensitivity Threshold in Quantitative X-Ray Phase Analysis. Journal of Analytical Chemistry 57, 1006–1008 (2002). https://doi.org/10.1023/A:1020921322805

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  • DOI: https://doi.org/10.1023/A:1020921322805

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