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Comments on AMSAA-BISE Reliability Growth Model (I)

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Abstract

From 1986 to 1991, based on AMSAA model, ZHOU Yuan-quan and WENG Zhao-xi presented AMSAA-BISE model to estimate reliability growth for multiple systems development, for the case that more than one system of the same type is put into reliability growth test, once a Type B failure mode is seen during test, corrective action will be taken to all systems. It is shown that there is something wrong with AMSAA-BISE model. According to AMSAA-BISE model, the maximum likelihood estimation of MTBF for multiple systems reliability growth test is much larger than that according to AMSAA model for a single system; The more systems is put into test, the larger the estimation of MTBF. An example is given, and an approximate method is presented.

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References

  1. Crow L H. Estimation procedures for the Duane model [R]. ADA019372, 1972,32-44.

  2. Crow L H(ed). AMSAA reliability growth symposium [R]. ADA027053. 1974.

  3. MIL-HDBK-189. Reliability Growth Management [S]. 1981.

  4. MIL-HDBK-781. Reliability Test Methods, Plans and Environments for Engineering Development, Qualification and Productions [S]. 1987.

  5. IEC TC-56(Co.)150. Reliability Growth Models and Estimation Methods [S], 1989.

  6. ZHOU Yuan-quan. Reliability growth for multi-system simultaneous development [J]. Applied Mathematics and Mechanics (English Edition), 1986,7(9):887-894.

    Google Scholar 

  7. ZHOU Yuan-quan, WENG Zhao-xi. AMSAA-BISE Model[A]. In: Mao Shisong, Y Sunada, Ed. 3rd Japan-China Symposium on Statistics [C]. Tokyo: Soka Univ: Tokyo,Japan, 1989,179-182.

    Google Scholar 

  8. ZHOU Yuan-quan, WENG Zhao-xi. AMSAA-BISE model and its statistical inference [J]. Journal of Systems Engineering and Electronics, 1991,(11):72-78.(in Chinese)

  9. ZHOU Yuan-quan, WENG Zhao-xi. The AMSAA-BISE model with gap intervals [J]. Journal of Systems Engineering and Electronics, 1990,(1):77-83.(in Chinese)

  10. ZHOU Yuan-quan, WENG Zhao-xi. Reliabiltiy Growth [M]. Beijing: Science Press, 1992.(in Chinese)

    Google Scholar 

  11. GJB1407-92. Reliability Growth Testing [S]. Beijing: China National Military Standard Publishing and Distribution Department, 1992.(in Chinese)

  12. GJB/Z77-95. Reliability Growth Management Handbook [S]. Beijing: China National Military Standard Publishing and Distribution Department, 1995.(in Chinese)

  13. MEI Wen-hua, YANG Yi-xian. Comments on reliability growth model in GJB/Z77 for multi-systems development [J]. Acta Aeronautica et Astronautica Sinica, 1999,20(1):65-68.(in Chinese)

    Google Scholar 

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Authors and Affiliations

  1. Beijing Aeronautial Technology Research Center, Beijing, 100076, P R China

    Wen-hua Mei & Yue-e Guo

  2. Beijing University of Posts and Telecommunications, Beijing, 100876, P R China

    Yi-xian Yang

Authors
  1. Wen-hua Mei
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  2. Yue-e Guo
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  3. Yi-xian Yang
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Mei, Wh., Guo, Ye. & Yang, Yx. Comments on AMSAA-BISE Reliability Growth Model (I). Applied Mathematics and Mechanics 22, 851–855 (2001). https://doi.org/10.1023/A:1016377907081

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  • DOI: https://doi.org/10.1023/A:1016377907081

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