Abstract
An analytical equation is proposed for the fluorescence intensity excited in total reflection X-ray fluorescence analysis. Errors in the results of analysis of solutions of hair samples caused by the mutual influence of elements and by the nonuniformity of the distribution of the material in the emitter are quantitatively estimated. It is shown that these effects are small. They can be efficiently corrected using the internal standard method, provided the difference between wavelengths of the compared lines is small. Otherwise, a decrease in the systematic error is insignificant. Experiments confirmed the theoretical conclusions.
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Pavlinskii, G.V., Smagunova, A.N., Karpukova, O.M. et al. Sources of Error in Total Reflection X-Ray Fluorescence Analysis and Error Correction Using the Internal Standard Method. Journal of Analytical Chemistry 57, 185–193 (2002). https://doi.org/10.1023/A:1014427928483
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DOI: https://doi.org/10.1023/A:1014427928483