Journal of Electronic Testing

, Volume 18, Issue 1, pp 55–62 | Cite as

Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption

  • Michiko Inoue
  • Emil Gizdarski
  • Hideo Fujiwara

Abstract

We show that the test generation problem for all single stuck-at faults in sequential circuits with internally balanced structures can be reduced into the test generation problem for single stuck-at faults in combinational circuits. In our previous work, we introduced internally balanced structures as a class of sequential circuits with the combinational test generation complexity. However, single stuck-at faults on some primary inputs, called separable primary inputs, corresponded to multiple stuck-at faults in a transformed combinational circuit. In this paper, we resolve this problem. We show how to generate a test sequence and identify undetectability for single stuck-at faults on separable primary inputs.

test generation combinational circuit sequential circuit balanced structure internally balanced structure 

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Copyright information

© Kluwer Academic Publishers 2002

Authors and Affiliations

  • Michiko Inoue
    • 1
  • Emil Gizdarski
    • 1
    • 2
  • Hideo Fujiwara
    • 1
  1. 1.Graduate School of Information ScienceNara Institute of Science and TechnologyIkomaJapan
  2. 2.Department of Computer SystemsUniversity of RousseBulgaria

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