Abstract
In this paper, all electro-optic solid immersion lens (EOSIL) is introduced, which is made of GaAs. A reflecting external electro-optic measuring system based on the EOSIL is built. With a hemispherical GaAs EOSIL used as the external probe, 0.7 µm spot size is obtained when the wavelength of the probing beam from a laser diode is 1.3 µm and a microscope objective with 0.3 numerical aperture is used. The principle of the measuring system is analyzed by Jones matrix. By using the system, the electrical signals propagating on a microstrip transmission line are successfully measured. The voltage sensitivity about 5 mV/\(\sqrt {Hz} \) is measured when 10 kHz sinusoidal electric signal is applied on the microstrip line.
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Chen, Z., Jia, G., Liu, Y. et al. Submicron External Electro-optic Measuring System Based on an Electro-optic Solid Immersion Lens. International Journal of Infrared and Millimeter Waves 22, 695–702 (2001). https://doi.org/10.1023/A:1010645726332
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DOI: https://doi.org/10.1023/A:1010645726332