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Instruments and Experimental Techniques

, Volume 47, Issue 5, pp 598–601 | Cite as

Ion-Implanted HPGe Detectors for Multilayer Spectrometers of Charged Particles

  • Yu. B. Gurov
  • K. N. Gusev
  • S. L. Katulina
  • M. Mitura-Novak
  • B. Raihel
  • V. G. Sandukovsky
  • J. Yurkowski
Article

Abstract

The results from development of planar HPGe detectors with thin (<0.1 μm) entrance windows produced by boron and phosphorus ion implantation are presented. These detectors are shown to have high electric and spectrometric characteristics. They have been designed for developing and updating the multilayer spectrometers that are currently used to study rare nuclear processes and to search for the deep states of xenon pionic atoms.

Keywords

Physical Chemistry Phosphorus Boron Charge Particle Xenon 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© MAIK “Nauka/Interperiodica” 2004

Authors and Affiliations

  • Yu. B. Gurov
    • 1
  • K. N. Gusev
    • 2
  • S. L. Katulina
    • 2
  • M. Mitura-Novak
    • 3
  • B. Raihel
    • 3
  • V. G. Sandukovsky
    • 2
  • J. Yurkowski
    • 3
  1. 1.Moscow Engineering Physics Institute (State University)MoscowRussia
  2. 2.Joint Institute for Nuclear ResearchMoscow oblastRussia
  3. 3.Institute of Nuclear PhysicsPolish Academy of SciencesKrakowPoland

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