Journal of Russian Laser Research

, Volume 24, Issue 3, pp 220–236 | Cite as

The Problem of Subrayleigh Resolution in Interference Microscopy

  • V. A. Andreev
  • K. V. Indukaev
Article

Abstract

A method allowing subwavelength resolution within the framework of optical interferometric microscopy is proposed. It is shown that overcoming the diffraction limit is not a necessary requirement. Generally speaking, “subrayleigh resolution” and “overcoming the diffraction limit” are basically different concepts. The method developed uses the all-parameter modulation of the light source and separation of the phase shifts generated due to different reasons. In this method, a topological phase technique is used to separate the phases and therefore determine the corresponding characteristics of an object. The approach developed provides for a way to create a new type of optical devices. Within the framework of a uniform measuring procedure these devices make possible determining both geometrical and material parameters of the object under study.

subwavelength resolution optical interferometric microscopy diffraction limit topological phases 

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Copyright information

© Plenum Publishing Corporation 2003

Authors and Affiliations

  • V. A. Andreev
    • 1
  • K. V. Indukaev
    • 1
  1. 1.AMPHORA Labs Co. Ltd., Suite 701MoscowRussia

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