Journal of Low Temperature Physics

, Volume 117, Issue 3–4, pp 515–519 | Cite as

Penetration depth variation in high quality YBaCuO thin films

  • E. Farber
  • S. Djordjevic
  • N. Bontemps
  • O. Durand
  • J.P. Contour
  • G. Deutscher
Article

Abstract

We report results obtained on state-of-the-art YBCO thin films prepared by pulsed laser deposition on LaAlO3substrates, using samples as similar as possible in two different experimental set-ups: a surface impedance measurement on 4000 Å thick films using a parallel plate resonator (10 GHz), and a far infrared transmission (100-400 GHz) measurement which requires thinner (1000 Å) samples. The measurements show a reduction of the penetration depth slope dMdT with improving quality of the thin films, which exhibit a low temperature scattering rate and residual surface resistance, comparable to single crystals. A linear fitting to the λ(T) experimental results yields dλ/dT=2 Å/K in both experiments in the low frequency limit.

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Copyright information

© Plenum Publishing Corporation 1999

Authors and Affiliations

  • E. Farber
    • 1
  • S. Djordjevic
    • 2
  • N. Bontemps
    • 2
  • O. Durand
    • 3
  • J.P. Contour
    • 4
  • G. Deutscher
    • 1
  1. 1.School of Physics and Astronomy, Raymond and Beverly Sackler Faculty of Exact ScienceTel Aviv UniversityRamat AvivIsrael)
  2. 2.Laboratoire de Physique de la Matière CondenséeEcole Normale SuperiéureParis cedex 05 (France)
  3. 3.LCR/Thomson-CSFOrsay (France)
  4. 4.Unité Mixte de Physique CNRS/Thomson-CSFOrsay (France)

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