Structural Chemistry

, Volume 14, Issue 1, pp 39–47

Imaging Magnetic Domain Structures with Soft X-Ray Microscopy

  • P. Fischer
  • T. Eimüller
  • G. Schütz
  • G. Denbeaux
Article

Abstract

The current achievements in magnetic transmission soft X-ray microscopy will be reviewed. The magnetic contrast is given by X-ray magnetic circular dichroism (X-MCD), i.e., the dependence of the absorption coefficient of circularly polarized X rays on the projection of the magnetization in a ferromagnetic system onto the photon propagation direction. X-MCD contrast can reach, e.g., at L2,3 edges in transition metals, large values up to 50%. Combined with a soft X-ray microscope where Fresnel zone plates acting as optical elements provide a lateral resolution down at 25 nm, it allows for imaging magnetic microstructures. Specific features of this photon-based technique are the recording of images in varying external magnetic fields, an inherent chemical specificity, a high sensitivity to thin magnetic layers, due to the large contrast, and the possibility to distinguish between in-plane and out-of plane contributions. In this report, recent results obtained with the XM-1 microscope at the ALS (Berkeley/CA) demonstrate the broad applicability of this novel experimental technique to both fundamental and technological relevant issues in nanomagnetism. The future potential will be briefly outlined.

X-ray magnetic circular dichroism soft X-ray microscopy magnetic domain structure circular polarized synchrotron radiation Fresnel zone plates 

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REFERENCE

  1. 1.
    Baibich, M. et al. Phys. Rev. Lett. 1988, 61, 2472PubMedGoogle Scholar
  2. 2.
    Prinz, G. A. Science 1998, 282, 1660PubMedGoogle Scholar
  3. 3.
    Allenspach, R. IBM J. Rese. Develop. 2000, 44, 553.Google Scholar
  4. 4.
    Pierce, D. T. et al. J. Magn. Magn. Mater. 2000, 222, 13.Google Scholar
  5. 5.
    Schneider, M. et al. Appl. Phys. Lett. 2000, 77, 2909.Google Scholar
  6. 6.
    Kirk, K. J. et al. J. Appl. Phys. 2001, 89, 7174.Google Scholar
  7. 7.
    Wiesendanger, R.; Bode, M., Solid State Commun. 2001, 119, 341.Google Scholar
  8. 8.
    Scholl, A. et al. J. Appl. Phys. 2001, 89, 7266.Google Scholar
  9. 9.
    Kuch, W. et al. J Phys. Rev. B 2000, 62, 3824.Google Scholar
  10. 10.
    Dahlberg, D.; Zhu. J. Physics Today 1995Google Scholar
  11. 11.
    Bonfim, M. et al. Phys. Rev. Lett. 2001, 86, 3646.PubMedGoogle Scholar
  12. 12.
    Fidler, J. et al. IEEE Trans. Magnet. 2001, 37, 2058.Google Scholar
  13. 13.
    Fischer, P. et al. Z. Physi. B 1996, 101, 313.Google Scholar
  14. 14.
    Fischer, P. et al. J. Phys. D Appl. Physi. 1998, 31, 649.Google Scholar
  15. 15.
    Fischer, P. et al. J. Magn. Soc. Jpn. 1999, 23, 205.Google Scholar
  16. 16.
    Schütz, G. et al. Phys. Rev. Lett. 1987, 58, 737.PubMedGoogle Scholar
  17. 17.
    Chen, C. T. et al. Phys. Rev. B 1990, 42, 7262.Google Scholar
  18. 18.
    Bahrdt, J. et al. Nucl. Instrum. Methods Phys. Res. A 2001, 467–468, 21.Google Scholar
  19. 19.
    Thole, B. T. et al. Phys. Rev. Lett. 1992, 68, 1943.PubMedGoogle Scholar
  20. 20.
    Carra, P. et al. Phys. Rev. Lett. 1993, 70, 694.PubMedGoogle Scholar
  21. 21.
    Stohr, J. et al. Science 1993, 259, 658.Google Scholar
  22. 22.
    See http://www-als.lbl.gov/als/als_users_bl/7.3.1.1–Datasheet.pdGoogle Scholar
  23. 23.
    Fischer, P. et al. Rev. Sci. Instr. 2001, 72, 2322.Google Scholar
  24. 24.
    Meyer-Ilse, W. et al. In X-ray Microscopy, Vol. 507; Meyer-Ilse, W.; Warwick, T.; Attwood, D., Eds.; American Institute of Physics: Melville, 2000; p. 129Google Scholar
  25. 25.
    Denbeaux, G.; Johnson, L. E.; Meyer-Ilse, W. In X-Ray Microscopy, Vol. 507; Meyer-Ilse, W.; Warwick, T.; Attwood, D., Eds.; American Institute of Physics: Melville, 2000 p. 478Google Scholar
  26. 26.
    Pearson, A. et al. Proc. SPIE, 2000, 4146, 54.Google Scholar
  27. 27.
    Kusinski, G. J. et al. Appl. Phys. Lette. 2001, 79, 2211.Google Scholar
  28. 28.
    Eimüller, T. et al. J. Appl. Phys. 2002, 91, 7334.Google Scholar
  29. 29.
    Fischer, P. et al. J. Appl. Phys. 2001, 89, 7159.Google Scholar
  30. 30.
    Fischer P. et al. 2001, Z. F. Metallkunde 2002, 93, 372.Google Scholar
  31. 31.
    Hubert A.; Schäfer R. Magnetic Domains, Springer: New York, 1998.Google Scholar
  32. 32.
    Geissler, J. et al. Phys. Rev. B 2002, 65, 1–4.Google Scholar

Copyright information

© Plenum Publishing Corporation 2003

Authors and Affiliations

  • P. Fischer
    • 1
  • T. Eimüller
    • 1
  • G. Schütz
    • 1
  • G. Denbeaux
    • 2
  1. 1.Max-Planck-Institute for Metals ResearchStuttgartGermany
  2. 2.Lawrence Berkeley National LaboratoryCenter for X-ray OpticsBerkeley

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