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Journal of Materials Science Letters

, Volume 20, Issue 13, pp 1181–1183 | Cite as

Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam

  • S. Rubanov
  • P. R. Munroe
Article

Keywords

Polymer Damage Layer 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Kluwer Academic Publishers 2001

Authors and Affiliations

  • S. Rubanov
    • 1
  • P. R. Munroe
    • 2
  1. 1.Electron Microscope UnitUniversity of New South WalesSydneyAustralia
  2. 2.Electron Microscope UnitUniversity of New South WalesSydneyAustralia

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