Journal of Porous Materials

, Volume 7, Issue 1–3, pp 17–22 | Cite as

Monitoring Anodic Silicon Dissolution in Acidic Fluoride Electrolyte by the Mirage Effect

  • Danilo Dini
  • Sandro Cattarin
  • Franco Decker


Probe beam deflection (PBD) technique was used for the in-situ characterization of p-Si anodic dissolution in fluoride containing acidic media in the regimes of porous Si formation, electropolishing and sustained electrochemical oscillations. When trends in deflectometric signal differed from those of current density, PBD could provide complementary informations on the occurrence of chemical reactions at the electrode. A model is proposed for the estimation of oxide thickness based on the instantaneous formation and dissolution rates in galvanostatic conditions. Results point to the existence of different oxide phases at the p-Si/electrolyte interface.

porous silicon electropolishing anodic silicon dissolution probe beam deflection technique 


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Copyright information

© Kluwer Academic Publishers 2000

Authors and Affiliations

  • Danilo Dini
    • 1
  • Sandro Cattarin
    • 2
  • Franco Decker
    • 1
  1. 1.Dipartimento di ChimicaUniversita' di Roma “La Sapienza”RomeItaly
  2. 2.Istituto di Polarografia ed Elettrochimica Preparativa—C.N.R.PaduaItaly

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