Journal of Electronic Testing

, Volume 16, Issue 1–2, pp 121–130 | Cite as

On Efficiently Producing Quality Tests for Custom Circuits in PowerPC™ Microprocessors

  • Li-C. Wang
  • Magdy S. Abadir


Custom circuits, in contrast to those synthesized by automatic tools, are manually designed blocks of which the performance is critical to the full chip operation. Testing these blocks represents a major challenge and thus a crucial time-to-market factor in today's PowerPC microprocessor design environment. This paper investigates various methodologies for testing custom blocks. Issues of efficiently obtaining proper circuit models for ATPG tools as well as producing quality tests will be analyzed and discussed. Tradeoffs among various methods will be analyzed and compared. Experience and results based on recent PowerPC microprocessors will be reported.

custom circuits ATPG high level circuit extraction DFT time-to-market 


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Copyright information

© Kluwer Academic Publishers 2000

Authors and Affiliations

  • Li-C. Wang
    • 1
  • Magdy S. Abadir
    • 2
  1. 1.Somerset PowerPC Design CenterMotorola Inc.AustinTexas
  2. 2.Somerset PowerPC Design CenterMotorola Inc.AustinTexas

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