Multiple Experiment Environments for Testing
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Concurrent simulation (CS) has been used successfully as areplacement for serial simulation. Based on storing differences fromexperiments, CS saves storage, speeds up simulation time and allowsexcellent internal observation of events. In this paper, we introduceMultiple Domain Concurrent Simulation (MDCS) which like concurrentsimulation, maintains efficiency by only simulating differences. MDCS alsoallows experiments to interact with one another and create new experimentsthrough the use of domains. These experiments can be traced and observed atany point, providing insight into the origin and causes of new experiments.While many experiment scenarios can be created, MDCS uses dynamic spawningand experiment compression rather than explicit enumeration to ensure thatthe number of experiment scenarios does not become exhaustive. MDCS does notrequire any pre-analysis or additions to the circuit under test. Providingthis capability in digital logic simulators allows more test cases to be runin less time. MDCS gives the exact location and causes of every experimentbehavior and can be used to track the signature paths of test patterns forcoverage analysis.
We will describe the algorithms for MDCS, discuss the rules forpropagating experiments and describe the concepts of domains for makingdynamic interactions possible. We will report on the effectiveness of MDCSfor attacking an exhaustive simulation problem such as Multiple Stuck-atFault simulations for digital logic. Finally, the applicability of MDCS formore general experimentation of digital logic systems will be discussed.
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