Normalised analysis for the design of evanescent-wave sensors and its use for tolerance evaluation
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The conditions for the optimisation of any step index waveguide evanescent-wave sensor and for the manufacturing tolerances are given in the form of analytical and normalised expressions. The analysis is made for both TE and TM modes, in both cases where the measurand is homogeneously distributed in the cover, and where it is an ultrathin film on the waveguide-cover interface.
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