Acta Mechanica Solida Sinica

, Volume 22, Issue 5, pp 436–442 | Cite as

Effect of Surface Energy on Dislocation-Induced Field in Half-Space with Application to Thin Film-Substrate Systems

  • Ganyun Huang
  • Bob Svendsen
  • Zhixing Lu


In this work the elastic field of an edge dislocation in a half-space with the effect of surface energy has been obtained. The elastic field is then used to study the image force on the dislocation, the critical thickness for dislocation generation in epitaxial thin films with strain mismatch and the yielding strength of thin films on substrates. The results show that the image forces on the dislocation deviate from the conventional solutions when the distance of the dislocation from the free surface is smaller than several times of the characteristic length. Also due to the effect of surface energy, the critical thickness for dislocation generation is smaller than that predicted by the conventional elastic solutions and the extent of the deviation depends on the magnitude of mismatch strain. In contrast, the effect of surface energy on the yielding strength for many practical thin films can be neglected except for some soft ones where the characteristic length is comparable to the thickness.

Key words

thin film surface energy effect dislocation half-space critical thickness yielding strength 


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Copyright information

© The Chinese Society of Theoretical and Applied Mechanics and Technology 2009

Authors and Affiliations

  1. 1.Institute of MechanicsDortmund University of TechnologyDortmundGermany
  2. 2.School of Mechanical EngineeringTianjin UniversityTianjinChina
  3. 3.Department of Mechanical EngineeringUniversity of Colorado at BoulderBoulderUSA

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