Abstract
A new inductively coupled plasma mass spectrometer with an enlarged sampling orifice (1.31-mm dia.) and an offset ion lens yields very low levels of many troublesome polyatomic ions such as ArO+, ArN+, Ar2 +, ClO+, and ArCl+. The signals from refractory metal oxide ions are ≈ 1% of the corresponding metal ion signals, which is typical of most ICP-MS devices. Grounding the first electrode of the ion lens greatly reduces the severity of matrix effects to <- 20% loss in signal for Co+, Y+, or Cs+ in the presence of 10 mM Sr, Tm, or Pb. This latter lens setting causes only a modest loss (30%) in sensitivity for analyte elements compared to the best sensitivity obtainable by biasing the first lens. Alternatively, matrix effects can also be mitigated by readjusting the voltage applied to the first lens with the matrix present.
Article PDF
Similar content being viewed by others
Avoid common mistakes on your manuscript.
References
Lam, J. W.; McLaren, J. W. J. Anal. Atom. Spectrom. 1990, 5, 419–445.
McLaren, J. W.; Lam, J. W.; Gustavsson, A. Spectrochim. Acta B 1990, 45, 109–1094.
Lam, J. W.; Horlick, C. Spectrochim. Acta B 1990, 45, 1313–1325.
Ebdon, L.; Evans, E. H.; Bamett, N. W. J. Anal. Atom. Spectrom. 1989, 4, 505–508.
Smith, F. G.; Wiederin, D. R.; Houk, R. S. Anal. Chem. 1991, 63, 1458–1462.
Houk, R. S.; Fassel, V. A.; Flesch, G. D.; Svec, H. J.; Gray, A. L.; Taylor, C. E. Anal. Chem. 1980, 52, 2283–2289.
Jakubowski, N.; Feldman, I.; Stuewer, D. Spectrochim. acta B 1992, 47, 107–118.
Jakubowski, N.; Feldman, I.; Stuewer, D.; Berndt, H. Spectrochim. Acta B 1992, 47, 119–129.
Alves, L. C.; Wiederin, D. R.; Houk, R. S. Anal. Chem. 1992, 64, 1164–1169.
Tsukahara, R.; Kubota, M. Spectrochim. Acta B 1990, 45, 581–589.
Jarvis, K. E.; Gray, A. L.; Houk, R. S. Handbcokoof Inductively Coupled Plasma Mass Specfrometry; Blackie: Glasgow, 1991.
Hutton, R. C. U. S. Patent 4760253, 1988.
Bradshaw, N.; Hall, E. F. H.; Sanderson, N. E. J. Anal. Atom. Spectrom. 1989, 4, 801–803.
Morita, M.; Ito, H.; Uehiro, T.; Otsuka, K. Anal. Sci. (Japan) 1989, 5, 609–610.
Rowan, J. T.; Houk, R. S. Appl. Spectrosc. 1989, 43, 976–980.
King, F. L.; Harrison, W. W. Int. J. Mass Spectrom. Ion Proc. 1989, 89, 171–185.
Duckworth, D. C.; Marcus, R. K. Appl. Spectrosc. 1990, 44, 649–655.
Olivares, J. A.; Houk, R. S. Anal. Chem. 1986, 58, 20–25.
Tan, S. H.; Horlick, G. J. Anal. Atom. Spectrom. 1987, 2, 745–763.
Gregoire, D. C. Appl. Spectrosc. 1987, 41, 897–903; Spectrochim. Acta B 1987, 42, 895–907.
Kawaguchi, H.; Tanaka, T.; Nakamura, T.; Morishita, M.; Mizuike, A. Anal. Sci. (Japan) 1987, 3, 305–308.
Beauchemin, D.; McLaren, J. W.; Berman, S. S. Spectrochim. Acta B 1987, 42, 467–490.
Gillson, G. R.; Douglas, D. J.; Fulford, J. E.; Halligan, K. W.; Tanner, S. D. Anal. Chem. 1988, 60, 1472–1474.
Tanner, S. D. Spectrochim. Acta B 1992, 47, 809–823.
Thompson, J. J.; Houk, R. S. Appl. Spectrosc. 1987, 41, 801–806.
Hu, K.; Clemons, P. S.; Houk, R. S. J. Am. Soc. Mass Spectrom. 1993, 4.
Ross, B. C.; Hieftje, G. M. Spectrochim. Acta B 1991, 46, 955–962.
Bear, B. R.; Fassel, V. A. Spectrochim. Acta B. 1986, 41, 1089–1113.
Evans, E. H.; Ebdon, L. J. Anal. Atom. Spectrom. 1989, 4, 299–300.
Hieftje, G. M. Winter Conference on Plasma Spectrochemistry; San Diego, CA, January, 1992; paper PL-6.
Vaughan, M. A.; Horlick, G. Spectrochim. Acta B 1990, 45, 1301–1311.
Vaughan, M. A.; Horlick, G. Spectrochim. Acta B 1990, 45, 1289–1299.
Douglas, D. J. In ICPs in Analytical Atomic Spectrometry, 2nd ed.; Montaser, A. and Golightly, D., Eds.; VCH: New York, 1992.
Longerich, H. P. J. Anal. Atom. Spectrom. 1989, 4, 491–497.
Kubota, M.; Fudagawa, N.; Kawase, A. Anal. Sci. (Japan) 1989, 5, 701–706.
Tarr, M. A.; Zhu, G.; Browner, R. F. Appl. Spectrosc. 1991, 45, 1424–1432.
Crain, J. S.; Houk, R. S.; Smith, F. G. Spectrochim. Acta B 1988, 43, 1355–1364.
Wang, J.; Shen, W. L.; Sheppard, B. S.; Evans, E. H.; Fricke, F. L.; Caruso, J. A. J. Anal. Atom. Spectrom. 1990, 5, 445–449.
Sheppard, B. S.; Shen, W. L.; caruso, J. A. Am. Soc. Mass Spectrom. 1991, 2, 355–361.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Hu, K., Houk, R.S. Inductively coupled plasma mass spectrometry with an enlarged sampling orifice and offset ion lens. II. Polyatomic Ion interferences and matrix effects. J Am Soc Mass Spectrom 4, 28–37 (1993). https://doi.org/10.1016/1044-0305(93)85039-Z
Received:
Revised:
Accepted:
Issue Date:
DOI: https://doi.org/10.1016/1044-0305(93)85039-Z