Space-charge effects on Fourier transform ion cyclotron resonance signals: Experimental observations and three-dimensional trajectory simulations
- 44 Downloads
- 11 Citations
Abstract
Space-charge effects were studied by monitoring Fourier transform ion cyclotron resonance spectra while scanning the laser wavelength near the origin of a two-photon resonant 3s ← n Rydberg transition of acetaldehyde. The rotational contour of the origin band permits the experimental control of space-charge density. Both the frequency shift and the inhomogeneous line broadening were observed as a function of space-charge density. Three-dimensional ion trajectories in the presence of Coulomb interactions between ions were simulated under the quadratic and exact trapping potentials. The simulated Fourier transform ion cyclotron resonance spectra were obtained from the image-charge signals induced by a uniform field of chirp or impulse excitation. Comparisons of experiments with three-dimensional simulations reveal that the inhomogeneous line broadening observed in experiments is most likely due to both large-amplitude oscillations of ions and Coulomb interactions between different m/q ions.
Keywords
Frequency Shift Coulomb Interaction Cyclotron Frequency Trapping Potential Inhomogeneous LinePreview
Unable to display preview. Download preview PDF.
References
- 1.Comisarow, M. C.; Marshall, A. G. Chem. Phys. Lett. 1974, 25, 282–283.CrossRefGoogle Scholar
- 2.Wanczek, K.-P. Int. J. Mass Spectrom. Ion Processes 1989, 95, 1–38.CrossRefGoogle Scholar
- 3.Dunbar, R. C. Mass Spectrom. Rev. 1992, 11, 309–339.CrossRefGoogle Scholar
- 4.Marshall, A. G.; Schweikhard, L. Int. J. Mass Spectrom. Ion Processes 1992, 118/119, 37–70.CrossRefGoogle Scholar
- 5.Guan, S.; Kim, H. S.; Marshall, A. G.; Wahl, M. C.; Wood, T. D.; Xiang, X. Chem. Rev. 1994, 94, 2161–2182.CrossRefGoogle Scholar
- 6.Irion, M. P.; Bowers, W. D.; Hunter, R. L.; Rowland, F. S.; McIver, R. T., Jr. Chem. Phys. Lett. 1982, 93, 375–379.CrossRefGoogle Scholar
- 7.Carlin, T. J.; Freiser, B. S. Anal. Chem. 1983, 55, 955–958.CrossRefGoogle Scholar
- 8.Zimmerman, J. A.; Watson, C. H.; Eyler, J. R. Anal. Chem. 1991, 63, 361–365.CrossRefGoogle Scholar
- 9.Sack, T. M.; McCrery, D. A.; Gross, M. L. Anal. Chem. 1985, 57, 1290–1295.CrossRefGoogle Scholar
- 10.Beggs, C. G.; Kuo, C.-H.; Wyttenbach, T.; Kemper, P. R.; Bowers, M. T. Int. J. Mass Spectrom. Ion Processes 1990, 100, 397–422.CrossRefGoogle Scholar
- 11.Wyttenbach, T.; Bowers, M. T. J. Phys. Chem. 1992, 96, 8920–8929.CrossRefGoogle Scholar
- 12.Shin, S. K.; Kim, B.; Haldeman, J. G.; Ran, S-J. J. Phys. Chem. 1996, 100, 8280–8284.CrossRefGoogle Scholar
- 13.Shin, S. K.; Han, S-J.; Kim, B. J. Am. Soc. Mass Spectrom. 1996, 7, 1018–1025.CrossRefGoogle Scholar
- 14.Jeffries, J. B.; Barlow, S. E.; Dunn, G. H. Int. J. Mass Spectrom. Ion Processes 1983, 54, 169–187.CrossRefGoogle Scholar
- 15.Francl, T. J.; Sherman, M. G.; Hunter, R. L.; Locke, M. J.; Bowers, W. D.; McIver, R. Jr. Int. J. Mass Spectrom. Ion Processes 1983, 54, 189–199.CrossRefGoogle Scholar
- 16.Chasman, C.; Baltz, A. J. Nucl. Iustrum. Methods Phys. Res. Rev. 1984, 219, 279–283.CrossRefGoogle Scholar
- 17.Wang, T.-C. L.; Marshall, A. G. Int. J. Mass Spectrom. Ion Processes 1986, 68, 287–301.CrossRefGoogle Scholar
- 18.Chen, S.-P.; Comisarow, M. B. Rapid Commun. Mass Spectrom. 1991, 5, 450–455.CrossRefGoogle Scholar
- 19.Chen, S.-P.; Comisarow, M. B. Rapid Commun. Mass Spectrom. 1992, 6, 1–4.CrossRefGoogle Scholar
- 20.Xiang, X.; Grosshans, P. B.; Marshall, A. G. Int. J. Mass Spectrom. Ion Processes 1993, 125, 33–43.CrossRefGoogle Scholar
- 21.Cornell, E. A.; Boyce, K. R.; Fygenson, D. L.; Pritchard, D. E. Phys. Rev. A 1992, 45, 3049–3059.CrossRefGoogle Scholar
- 22.Mitchell, D. W.; Smith, R. D. Phys. Rev. E 1995, 52, 4366–4386.CrossRefGoogle Scholar
- 23.Hendrickson, C. L.; Beu, S. C.; Laude, D. A., Jr. J. Am. Soc. Mass Spectrom. 1993, 4, 909–916.CrossRefGoogle Scholar
- 24.Huang, J.; Tiedemann, P. W.; Land, D. P.; McIver, R. T.; Hemminger, J. C. Int. J. Mass Spectrom. Ion Processes 1994, 134, 11–21.CrossRefGoogle Scholar
- 25.Naito, Y.; Inoue, M. J. Mass Spectrom. Soc. Japan 1994, 42, 1–9.Google Scholar
- 26.Uechi, G. T.; Dunbar, R. C. J. Am. Soc. Mass. Spectrom. 1992, 3, 734–741.CrossRefGoogle Scholar
- 27.Gorshkov, M. V.; Marshall, A. G.; Nikolaev, E. N. J. Am. Soc. Mass. Spectrom. 1993, 4, 855–868.CrossRefGoogle Scholar
- 28.Heath, B. A.; Robin, M. B.; Kuebler, N. A.; Fisanick, G. J.; Eichelberger, T. S., IV J. Chem. Phys. 1980, 72, 5565–5570.CrossRefGoogle Scholar
- 29.Gu, H.; Kundu, T.; Goodman, A. J. Phys. Chem. 1993, 97, 7194–7200.CrossRefGoogle Scholar
- 30.Fisanick, G. J.; Eichelberger, T. S., IV J. Chem. Phys. 1981, 74, 6692–6699.CrossRefGoogle Scholar
- 31.Ledford, E. B.; Rempel, D. L.; Gross, M. L. Anal. Chem. 1984, 56, 2744–2748.CrossRefGoogle Scholar
- 32.Sharp, T. E.; Eyler, J. R.; Li, E. Int. J. Mass Spectrom. Ion Processes 1972, 9, 421–439.CrossRefGoogle Scholar
- 33.Grosshans, P. B.; Shields, P. J.; Marshall, A. G. J. Chem. Phys. 1991, 94, 5341–5352.CrossRefGoogle Scholar
- 34.Levy, R. H.; Hockney, R. W. Phys. Fluids 1968, 11, 766–771.CrossRefGoogle Scholar
- 35.Hockney, R. W.; Eastwood, J. W. Computer Simulation Using Particles; McGraw-Hill: New York, 1981; Chap. 4.Google Scholar
- 36.Schweikhard, L.; Marshall, A. G. J. Am. Soc. Mass. Spectrom. 1993, 4, 433–452.CrossRefGoogle Scholar
- 37.Rempel, D. L.; Huang, S. K.; Gross, M. L. Int. J. Mass Spectrom. Ion Processes 1986, 70, 163–184.CrossRefGoogle Scholar
- 38.Dunbar, R. C.; Chen, J. H.; Hays, J. D. Int. J. Mass Spectrom. Ion Processes 1984, 57, 39–56.CrossRefGoogle Scholar
- 39.Mitchell, D. W. Int. J. Mass Spectrom. Ion Processes 1991, 107, 417–434.CrossRefGoogle Scholar
- 40.Shin, S. K.; Ran, S.-J. Int. J. Mass Spectrom. Ion Processes 1996, 153, 87–99.CrossRefGoogle Scholar
- 41.Nikolaev, E. N.; Miluchihin, N. V.; Inoue, M. Int. J. Mass Spectrom. Ion Processes 1995, 148, 145–157.CrossRefGoogle Scholar