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Dielectric Spectroscopy of A-Site and B-Site Modified K0.5Na0.5NbO3–Bi0.5Na0.5TiO3 Based Material

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Abstract

We report the results of temperature and frequency dependent dielectric properties of a structural modified K0.5Na0.5NbO3–Bi0.5Na0.5TiO3 based material; (Bi0.4La0.1K0.5Nb0.5Fe0.5O3) to attain a lead free alternative for the fabrication of multifunctional devices. The X-ray diffraction (XRD) analysis reveals the formation of rhombohedral crystal structure. The dielectric constant measurements indicate that the transition temperatures were independent of measured frequencies. The frequency dependent dielectric constant and loss tangent showed a decreasing trend. The observed dielectric loss anomalies were relatively weak near the transition temperature. The remnant polarization (Pr) and coercivity (Ec) of the sample were found to be 9.848 µC/cm2, and 0.511 kV/cm respectively.

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Authors and Affiliations

  1. Department of Physics, Veer Surendra Sai University of Technology, Burla, Sambalpur, Odisha, 768018, India

    Parbati Naik, Amrita Nayak & Sunanda Kumari Patri

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  1. Parbati Naik
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  2. Amrita Nayak
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  3. Sunanda Kumari Patri
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Naik, P., Nayak, A. & Patri, S.K. Dielectric Spectroscopy of A-Site and B-Site Modified K0.5Na0.5NbO3–Bi0.5Na0.5TiO3 Based Material. Trans. Electr. Electron. Mater. 24, 149–153 (2023). https://doi.org/10.1007/s42341-022-00425-5

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