1 Correction to: Transactions on Electrical and Electronic Materials (2021) 22:133–139 https://doi.org/10.1007/s42341-021-00285-5
Unfortunately, the original publication of the article was published without keywords. The keywords are given in this correction.
Keywords
Thin-Film transistor
Silicon doping
Low-frequency noise
X-ray photoelectron spectroscopy
The original article has been corrected.
Author information
Authors and Affiliations
Corresponding author
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
About this article
Cite this article
Lee, B.H., Kim, D., Lee, D. et al. Correction to: Effect of Silicon Doping on the Electrical Performance of Amorphous SiInZnO Thin‑film Transistors. Trans. Electr. Electron. Mater. 22, 383 (2021). https://doi.org/10.1007/s42341-021-00323-2
Published:
Issue Date:
DOI: https://doi.org/10.1007/s42341-021-00323-2