1 Correction to: Transactions on Electrical and Electronic Materials https://doi.org/10.1007/s42341-019-00125-7
In the original publication of the article the sentence in the conclusions section that reads as “Both str crystalline and amorphous structures of SnO2 were observed” should read as “Both crystalline and amorphous structures of SnO2 were observed”.
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Kim, KS., Woo, JC. Correction to: Microstructural Characteristics of Oxide Layer Growth on Tin Whisker and Finish Surface. Trans. Electr. Electron. Mater. 20, 383 (2019). https://doi.org/10.1007/s42341-019-00129-3
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DOI: https://doi.org/10.1007/s42341-019-00129-3