1 Correction to: Nanomanufacturing and Metrology (2022) 5:83–90 https://doi.org/10.1007/s41871-021-00119-1
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Misumi, I., Kizu, R., Itoh, H. et al. Correction: Research Activities of Nanodimensional Standards Using Atomic Force Microscopes, Transmission Electron Microscope, and Scanning Electron Microscope at the National Metrology Institute of Japan. Nanomanuf Metrol 5, 445 (2022). https://doi.org/10.1007/s41871-022-00171-5
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DOI: https://doi.org/10.1007/s41871-022-00171-5