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Persistence diagrams with linear machine learning models


Persistence diagrams have been widely recognized as a compact descriptor for characterizing multiscale topological features in data. When many datasets are available, statistical features embedded in those persistence diagrams can be extracted by applying machine learnings. In particular, the ability for explicitly analyzing the inverse in the original data space from those statistical features of persistence diagrams is significantly important for practical applications. In this paper, we propose a unified method for the inverse analysis by combining linear machine learning models with persistence images. The method is applied to point clouds and cubical sets, showing the ability of the statistical inverse analysis and its advantages.

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Corresponding author

Correspondence to Ippei Obayashi.

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Conflict of interest

On behalf of all authors, the corresponding author states that there is no conflict of interest.

Additional information

This work is partially supported by JSPS KAKENHI Grant Number JP 16K17638, JST CREST Mathematics15656429, JST “Materials research by Information Integration” Initiative (MI2I) project of the Support Program for Starting Up Innovation Hub, Structural Materials for Innovation Strategic Innovation Promotion Program D72 and D66, and New Energy and Industrial Technology Development Organization (NEDO).

A Algorithm for generating random images

A Algorithm for generating random images

The algorithm for generating random binary images is given by Algorithm 2. It consists of six parameters, \(W, N, S\in \mathbb {N}, \sigma _1> 0, \sigma _2 > 0\), and \(t >0\). The area of white pixels in the generated image is given by the orbits of the Brownian motion of N particles on a flat torus with the size \(W \times W\). The parameters S and \(\sigma _1\) determine the length of each orbit and \(\sigma _2\) and t determine the radii of particles. In this paper we fix \(W=300\), \(\sigma _1 = 4\), \(\sigma _2 = 2\), \(t = 0.01\), and only N and S are changed. When N and S become larger, the generated image tend to have more white pixels.

These kinds of random images are frequently obtained by experimental measurements in materials science such as X-CT and TEM (Kimura et al. 2017). These seemingly disordered images are supposed to be utilized for materials informatics, and one of the motivations of this paper is to develop a universal framework for this purpose.


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Obayashi, I., Hiraoka, Y. & Kimura, M. Persistence diagrams with linear machine learning models. J Appl. and Comput. Topology 1, 421–449 (2018).

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  • Topological data analysis
  • Persistent homology
  • Machine learning
  • Linear models
  • Persistence image

Mathematics Subject Classification

  • 55-04
  • 55U99
  • 62P35
  • 62J07