Formulae for secondary electron yield from insulators and semiconductors

  • Ai-Gen Xie
  • Min Lai
  • Yu-Lin Chen
  • Yu-Qing Xia


The processes and characteristics of secondary electron emission in insulators and semiconductors were studied, and the formulae for the maximum yield (δ m) at W p0m ≤ 800 eV and the secondary electron yield from insulators and semiconductors δ at the primary incident energy of 2 keV ≤ W p0 < 10 keV (δ 2–10) and 10 keV ≤ W p0 ≤ 100 keV (δ 10–100) were deduced. The calculation results were compared with their corresponding experimental data. It is concluded that the deduced formulae can be used to calculate δ 2–100 at W p0m ≤ 800 eV.


Maximum secondary electron yield Insulators and semiconductors Secondary electron yield 


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Copyright information

© Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Chinese Nuclear Society, Science Press China and Springer Nature Singapore Pte Ltd. 2017

Authors and Affiliations

  1. 1.School of Physics and Optoelectronic EngineeringNanjing University of Information Science and TechnologyNanjingChina

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