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Nondestructive visualization of graphene on Pt with methylene blue surface modification

通过亚甲基蓝表面修饰实现对生长在铂上的石墨烯 的无损可视化

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Abstract

Efficient large-scale nondestructive quality assessment of graphene on Pt is essential to the in-depth growth research and practical applications of graphene. Here, we present a very simple method for directly observing the domains and defects in graphene on Pt using an ordinary optical microscope. This was achieved by modifying graphene on Pt using methylene blue (MB). Because the chemical activities of graphene and Pt surface differ significantly, the adsorption and reaction of MB on graphene and platinum surface differ. We can determine the distribution of graphene crystal domains and defects by comparing the colors in the optical images. In addition, this characterization method causes no obvious damage to the Pt substrate and graphene. Moreover, it does not affect the recycling of the substrate or the subsequent characterization or application of graphene. Our study provides a nondestructive method for measuring the quality of graphene on Pt on a large scale, as well as a reference for the characterization and doping of other two-dimensional materials.

摘要

对石墨烯质量的高效大规模的无损检测是推进其生长研究和实 际应用的关键. 在这里, 我们报告了一种非常简单的方法: 用普通的光 学显微镜来直接观测生长在铂上的石墨烯的形貌和缺陷. 该工艺通过 亚甲基蓝(MB)对在铂上的石墨烯进行修饰来实现. 由于石墨烯和铂表 面的化学活性不同, MB在石墨烯和铂表面的吸附和反应也不同. 通过 对比光学图像中的颜色, 我们可以观测到石墨烯晶畴和缺陷的分布. 此 外, 该表征方法对铂衬底和石墨烯均无明显损伤, 不影响衬底的再利用 和石墨烯的后续表征或应用. 我们的工作为大规模检测生长在铂上的 石墨烯的质量提供了一种非破坏性的方法, 也为其他检测二维材料的 质量和掺杂情况提供了参考.

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Acknowledgements

This work was financially supported by the National Defense Technology Innovation Special Zone Project, the National Natural Science Foundation of China (51402342), and the Science and Technology Commission of Shanghai Municipality (20501130200).

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Authors and Affiliations

  1. State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, China

    He Kang  (康鹤), Yanhui Zhang  (张燕辉), Shike Hu  (胡诗珂), Jing Li  (李晶), Zhiying Chen  (陈志蓥), Yanping Sui  (隋妍萍), Shuang Wang  (王爽), Sunwen Zhao  (赵孙文), Runhan Xiao  (肖润涵) & Guanghui Yu  (于广辉)

  2. Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China

    He Kang  (康鹤), Shike Hu  (胡诗珂), Jing Li  (李晶), Shuang Wang  (王爽), Sunwen Zhao  (赵孙文), Runhan Xiao  (肖润涵) & Guanghui Yu  (于广辉)

  3. Science and Technology on Monolithic Integrated Circuits and Modules Laboratory, Nanjing Electronic Device Institute, Nanjing, 210016, China

    Yun Wu  (吴云)

  4. Microwave Devices and Integrated Circuits Department, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, 100029, China

    Songang Peng  (彭松昂), Zhi Jin  (金智) & Xinyu Liu  (刘新宇)

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  1. He Kang  (康鹤)
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  2. Yanhui Zhang  (张燕辉)
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  3. Yun Wu  (吴云)
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  11. Guanghui Yu  (于广辉)
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  12. Songang Peng  (彭松昂)
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  13. Zhi Jin  (金智)
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  14. Xinyu Liu  (刘新宇)
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Contributions

Kang H, Zhang Y, and Yu G designed the experiments. Kang H grew the graphene samples. Wu Y produced TLM devices. Hu S performed the SEM testing. Li J performed the OM characterization. Chen Z conducted the transfer of graphene. Sui Y and Wang S performed the Raman characterizations of all samples and analyses. Zhao S performed the AFM characterization. Xiao R performed the XRD testing. Peng S performed the EDS testing. Jin Z performed the EBSD testing. Liu X analyzed the data. Kang H, Zhang Y, and Wu Y wrote the paper. All the authors discussed and commented on the manuscript. The manuscript was written by the contributions of all authors. All the authors have approved the final version of the manuscript.

Corresponding authors

Correspondence to Yanhui Zhang  (张燕辉), Yun Wu  (吴云) or Guanghui Yu  (于广辉).

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Conflict of interest

The authors declare that they have no conflicts of interest.

Supplementary information

Supporting data are available in the online version of the paper.

He Kang is a Master student under the guidance of Prof. Guanghui Yu at Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, China. He received his BSc degree from the School of Materials Science and Engineering, Changchun University of Science and Technology in 2017. His current research interest focuses on the growth and application of high quality 2D materials.

Yanhui Zhang received his PhD degree from the National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences in 2011. Then he worked at Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences and is currently an associate professor. His current research interest includes the controlled growth and application exploration of 2D crystals.

Yun Wu received his doctorate in microelectronics and solid state electronics from Wuhan University. Since August 2012, he has worked at the 55 Research Institute of China Electronics Technology Group Corporation. At present, he is employed as a senior engineer and becomes the leader of the 2D device research group, which focuses on the application research of graphene materials in radio frequency, terahertz and infrared devices.

Guanghui Yu received his BSc degree from Jilin University. He obtained his PhD degree from Changchun Institute of Physics, Chinese Academy of Sciences in 1999. Then he worked as a postdoctoral fellow at Chiba University, Japan (1999–2002). He is currently a professor and has been a group leader at Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences since 2002. His current research interest includes the controlled growth and application exploration of 2D crystals.

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Kang, H., Zhang, Y., Wu, Y. et al. Nondestructive visualization of graphene on Pt with methylene blue surface modification. Sci. China Mater. 65, 2763–2770 (2022). https://doi.org/10.1007/s40843-022-2038-4

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  • DOI: https://doi.org/10.1007/s40843-022-2038-4

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