摘要
为完善范德瓦尔斯层状材料有关于拉曼张量的基本信息, 本文采用角分辨偏振拉曼光谱对二硫化钨的拉曼张量进行研究. 根据拉曼选择定则, 我们分析了角分辨拉曼光谱与偏振的依赖关系, 并结合实验结果获得了面内和面外各振动模式的拉曼张量元和与张量元对应的微分极化率等信息. 实验结果表明, 截面测试得到的拉曼强度具有偏振依赖性, 其中沿c轴振动的A1g模式引起的微分极化率明显大于E1g和E2g模式, 并且A1g模式自身在沿c轴的极化率也较沿a轴或b轴的大. 这种通过角分辨偏振拉曼光谱研究拉曼张量的方法对其他范德瓦尔斯层状材料具有普遍性.
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Acknowledgements
This work was supported by the National Natural Science Foundation of China (91833301, 61427901, 61604178 and U1505252), and the Guangzhou Science and Technology Program (201607020036).
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Author contributions Ding Y, Lin Z, and Zhu R performed the experiments; Jin M and Zhu Y designed the model and performed the calculations; Ding Y wrote the paper with support from Zheng W and Huang F. All authors contributed to the general discussion.
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Ying Ding was born in 1995. She is a PhD candidate at the School of Materials, Sun Yatsen University under the supervision of Prof. Feng Huang and Prof. Wei Zheng. Her current scientific research direction is mainly on the Raman tensor of van der Waals layered materials.
Wei Zheng received his PhD degree from Shenzhen University in 2014. Now he is a professor in the School of Materials at Sun Yat-sen University. His research interest focuses on semiconductor-based vacuum-ultraviolet (10-200 nm) photodetectors and condensed matter physics in ultra-wide bandgap semiconductors.
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Ding, Y., Zheng, W., Lin, Z. et al. Raman tensor of layered WS2. Sci. China Mater. 63, 1848–1854 (2020). https://doi.org/10.1007/s40843-020-1321-4
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DOI: https://doi.org/10.1007/s40843-020-1321-4