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High-temperature interface superconductivity in bilayer copper oxide films by pulsed laser deposition

脉冲激光沉积法制备双层结构铜氧化物界面高温 超导

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Abstract

In a seminal work, Gozar et al. reported on the high-temperature interface superconductivity in bilayers of insulating La2CuO4 and metallic La2−xSrxCuO4 (x=0.45). An interesting question to address is how general and robust this interface superconductivity is. In the past, the cuprate bilayers were grown in a unique atomic-layer molecular beam epitaxy system, with a Sr doping range of x≤0.47, and the atomically flat interface was thought to be indispensable. Here, we have fabricated bilayers of La2CuO4 and La2−xSrxCuO4 by pulsed laser deposition. We have tried to extend the nominal doping range of Sr from the previous maximum of 0.47 to the present 1.70 (the nominal Sr content in the targets). X-ray diffraction result indicates that our La2−xSrxCuO4 films with x≤0.60 have very high crystalline quality; but the film crystalline structure degrades gradually with further increasing x, and finally the structure is fully lost when x reaches 1.40 and higher. Although the film quality scatters dramatically, our experiments show that there exists superconductivity for bilayers in nearly the entire over-doped Sr range, except for a non-superconducting region at x∼0.80. These observations demonstrate that the interface superconductivity in copper oxides is very general and robust.

摘要

在2008年发表的一篇经典工作中, Gozar等人报道了由绝缘 性的La2CuO4和金属性的La1.55Sr0.45CuO4双层薄膜构成的体系存在 界面超导. 一个重要的有待回答的问题是该界面超导是否强健以 及具有普遍性. 在Gozar等人的工作中, 铜氧化物双层结构是利用 特制的氧化物分子束外延设备生长的, 最大Sr掺杂量仅为0.47. 在 本工作中, 我们首次利用脉冲激光沉积法制备了铜氧化物双层结 构, 并重复出了上述界面超导工作. 在此基础上, 我们将Sr的掺杂 范围大幅扩展到1.70, 结果表明在由La2CuO4 和过掺杂的 La2−xSrxCuO4构成的双层结构中界面超导非常强健和普遍. 值得一 提的是, 我们发现在x>0.8范围内存在一个新的界面超导区间.

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Acknowledgements

This work was supported by the National Key Research and Development Program of Ministry of Science and Technology of China (2017YFA0303002, 2016YFA0300204, and 2016YFA0300701), and the Fundamental Research Funds for the Central Universities.

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Contributions

Deng JH, Ren TS, and Ju LL performed the sample fabrication, transport measurements, and AFM characterization; Zhang HR, Sun JR, and Shen BG performed XRD measurements; Xie YW designed the experiment and wrote the manuscript. All authors contributed to data analysis and discussion.

Corresponding author

Correspondence to Yan-wu Xie  (谢燕武).

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Conflict of interest

The authors declare that they have no conflict of interest.

Supplementary information

The data of XRR and AFM, and an example for defining “T”, are available in the online version of the paper.

Jia-hao Deng is currently a master’s degree candidate at the Department of Physics Zhejiang University. He received his bachelor degree from Nanchang University in 2017. His research is focused on the interface superconductivity in La2−xSrxCuO4.

Tian-shuang Ren is currently a PhD candidate at the Department of Physics Zhejiang University. He received his bachelor degree (majored in physics) from Lanzhou University in 2017. His PhD research focuses on the growth and characterization of iridates and high-Tc cuprates.

Yan-wu Xie is currently a professor at the Department of Physics Zhejiang University. He received his PhD in physics from the Institute of Physics, CAS, in 2007. From 2007 to 2009, he was an associate professor at Yanshan University. From 2009 to 2011, he was a JSPS postdoctoral fellow at Tokyo University. From 2011 to 2015, he was a postdoctoral scholar and later a staff research associate at Stanford University. He joined Zhejiang University in June 2015. His research interests include superconductivity and electron gas at interfaces of complex oxides.

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Den, Jh., Ren, Ts., Ju, Ll. et al. High-temperature interface superconductivity in bilayer copper oxide films by pulsed laser deposition. Sci. China Mater. 63, 128–135 (2020). https://doi.org/10.1007/s40843-019-9500-1

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