Abstract
In this work we investigate the damage induced on a graphene–nickel interface after the exposure to Nd:YAG infrared laser radiation. The damage threshold has been experimentally determined. We observe that once the fluence exceeds the threshold value, both the morphology and the physical–chemical properties of the samples change. This has been verified by scanning probe microscopes measurements and near edge x-ray absorption fine structure spectroscopy analysis.
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Acknowledgments
The NEXAFS measurements were performed at BEAR beamline–ELETTRA Synchrotron Trieste in the frame of the proposal N. 20140398 “GRAphene Oxide PHotoreductIon: properTies at the interfacE (GRAPHITE)” at BEAR beamline–ELETTRA Synchrotron Trieste. The authors thank Prof. S. Nannarone and Dr. A. Giglia for supporting the measurements campaigns.
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Zuppella, P., Gerlin, F., Corso, A.J. et al. Nd:YAG Laser Damage of Graphene–Nickel Interfaces. Lasers Manuf. Mater. Process. 3, 131–139 (2016). https://doi.org/10.1007/s40516-016-0026-7
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DOI: https://doi.org/10.1007/s40516-016-0026-7