Abstract
The submicron chromium dioxide(CrO2) thin film was fabricated on a poly-crystal titania(TiO2) film using Si wafers as substrates by atmospheric pressure chemical vapor deposition(CVD) method. X-Ray diffraction patterns show that the CrO2 films were pure rutile structure. Scanning electron microscopy(SEM) images indicate that the CrO2 films consisted of submicron grains with a grain size of 250–750 nm. The magnetic researches reveal that the magnetic easy axis is parallel to the films, and at room temperature, the CrO2 films show linear magnetoresistance.
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Supported by the the National Natural Science Foundation of China(Nos.50972048, 61201007), the Fundamental Research Fund for the Central Universities of China(No.ZYGX2011J022), the Youth Fund of Education Department of Jiangxi Province of China(No.GJJ12575) and the Open Project of State Key Laboratory of Superhard Materials(Jilin University) of China (No.201213).
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Yuan, Jj., Wen, Gh., Zhao, Q. et al. Preparation and magnetic properties of submicron CrO2 thin film on poly-crystal TiO2 film. Chem. Res. Chin. Univ. 29, 600–602 (2013). https://doi.org/10.1007/s40242-013-2382-6
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DOI: https://doi.org/10.1007/s40242-013-2382-6