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Identification of octahedral configuration in strained SrRuO3 thin films

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Abstract

The compressively strained (2 2 0)-oriented SrRuO3 epitaxial thin films were grown on c-plane SrTiO3 substrates using pulsed laser deposition. Temperature-dependent lattice changes associated with structural phase transition were investigated through in-situ X-ray diffractions with varying temperature ranges from 25 to 650 °C under atmospheric conditions. Strong modulation of the in-plane lattices between the strained SrRuO3 thin film and SrTiO3 substrate was observed. The structural phase transition from pseudo-orthorhombic to the tetragonal structure was determined at around 285 °C and epitaxial strain was persistent during the structural phase transition in the fully strained SrRuO3/SrTiO3 heterostructured thin film. Crystal symmetry and the corresponding RuO6 octahedral configurations were verified that the compressively strained SrRuO3 thin film has pseudo-orthorhombic (monoclinic, P21/m, #11) structure with the BO6 configuration of a+a–c– at 25 °C and tetragonal (I4/mcm, #140) with the octahedral tilt of a0a0c– above 285 °C through structural model calculations based on the diffraction data of 20 individual half-order peaks.

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Acknowledgements

This work was supported by Pukyong National University Research Fund in 2019 (CD20191037) and the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (NRF-2020R1F1A1073076). This research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (NRF-2022R1I1A1A01065234).

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  1. Department of Physics, Pukyong National University, Busan, 48513, Korea

    Tae Hwa Eom, Sang A. Lee & Jae-Yeol Hwang

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  1. Tae Hwa Eom
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Eom, T.H., Lee, S.A. & Hwang, JY. Identification of octahedral configuration in strained SrRuO3 thin films. J. Korean Phys. Soc. 83, 65–71 (2023). https://doi.org/10.1007/s40042-023-00862-2

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