Abstract
Transition metal perovskite oxides display a variety of emergent phenomena which are tunable by tailoring the oxygen octahedral rotation. SrRuO\(_3\), a ferromagnetic perovskite oxide, is well known to have various atomic structures and octahedral rotations when grown as thin films. However, how the electronic structure changes with the film thickness has been hardly studied. Here, using angle-resolved photoemission spectroscopy and electron diffraction techniques, we study the electronic structure of SrRuO\(_3\) thin films as a function of the film thickness. Different reconstructed electronic structures and spectral weights are observed for films with various thicknesses. We suggest that octahedral rotations on the surface can be qualitatively estimated via comparison of intensities of different bands. Our observation and methodology shed light on how structural variation and transition may be understood in terms of photoemission spectroscopy data.
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Acknowledgements
We gratefully acknowledge insightful discussions with Younsik Kim. This work is supported by the Institute for Basic science in Korea (Grant No. IBS-R009-G2). CK acknowledges the supported by the National Research Foundation of Korea(NRF) grant funded by the Korea government(MSIT) (No. 2022R1A3B1077234).
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Sohn, B., Kim, C. Evolution of electronic band reconstruction in thickness-controlled perovskite SrRuO\(_3\) thin films. J. Korean Phys. Soc. 81, 1250–1256 (2022). https://doi.org/10.1007/s40042-022-00633-5
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DOI: https://doi.org/10.1007/s40042-022-00633-5