Abstract
The electron band structure of single-layer Cu\(_2\)Si self-assembled on Si(111) has been investigated using angle-resolved photoemission spectroscopy. Cu\(_2\)Si is a two-dimensional (2D) Dirac nodal-line semimetal that is protected by the in-plane mirror reflection symmetry. Indeed, the electron band structure of Cu\(_2\)Si shows non-dispersive states as a function of photon energy, whereas the electron band structure from the substrate shows strong photon energy dependence, supporting the 2D nature of Cu\(_2\)Si. Polarization dependence shows that the spectral intensity of the electron band structure of Cu\(_2\)Si is strongly but not completely suppressed when measured using photons with in-plane polarization. These findings indicate that Cu\(_2\)Si is deformed along the out-of-plane direction, so that the out-of-plane mirror symmetry becomes important in the topological properties of Cu\(_2\)Si when it is placed on an Si(111) substrate.
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This work was supported by the 2-Year Research Grant from the Pusan National University.
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Joo, HJ., Lee, JE., Eom, JH. et al. Dimensionality and bonding characters of Cu\(_2\)Si self-assembled on Si(111). J. Korean Phys. Soc. 81, 779–783 (2022). https://doi.org/10.1007/s40042-022-00597-6
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DOI: https://doi.org/10.1007/s40042-022-00597-6