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Optical properties of transition-metal oxide thin films deposited using a pulsed laser

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Abstract

Transition-metal oxide thin films of V2O5, ZrO2, and CeO2 were fabricated on MgO single-crystal substrates using a pulsed-laser deposition technique. The linear optical transmission spectra were measured at room temperature, and the data showing a fringe pattern in the transparent spectral region were used to determine the linear refractive indices of the films. The values of the linear refractive indices decrease with increasing wavelength, and the relationship could be well explained using Wemple’s theory. The third-order nonlinear optical properties of the films were determined using a single-beam z-scan method at a wavelength of 532 nm. The results showed that the prepared V2O5 film exhibited a fast third-order nonlinear optical response, with the nonlinear absorption coefficient and the nonlinear refractive index being 3.97 × 10–10 m/W and 4.55 × 10–17 m2/W, respectively, which are larger than those for the ZrO2 and the CeO2 films. The metal–oxygen bond lengths based on the bond-orbital theory could be used to explain these results.

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Acknowledgements

The authors acknowledge the financial support from the National Natural Science Foundation of China under Grand No. 10704065.

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Authors and Affiliations

  1. Institute of Opto-Electronic Information Science and Technology, Yantai University, Yantai, 264005, People’s Republic of China

    Liqi Cui, Ruiteng Wang & Weitian Wang

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  1. Liqi Cui
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  2. Ruiteng Wang
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  3. Weitian Wang
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Correspondence to Weitian Wang.

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Cui, L., Wang, R. & Wang, W. Optical properties of transition-metal oxide thin films deposited using a pulsed laser. J. Korean Phys. Soc. 79, 191–196 (2021). https://doi.org/10.1007/s40042-021-00190-3

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