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Pfeffer, R., Herrmann, M. & Kemper, H. Efficient Failure Rate Estimation Using AI-Based Simulation of Critical Scenarios. ATZ Electron Worldw 18, 8–13 (2023). https://doi.org/10.1007/s38314-023-1528-7
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DOI: https://doi.org/10.1007/s38314-023-1528-7