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Meier, M., Schmidt, M. & Maser, T. Complete Turnkey Concepts for Seamless E/E Validation - Focusing on ADAS/AD. ATZ Electron Worldw 18, 20–24 (2023). https://doi.org/10.1007/s38314-023-1484-2
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DOI: https://doi.org/10.1007/s38314-023-1484-2