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X-in-the-Loop - A Universal Testing Methodology

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ATZelectronics worldwide Aims and scope

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ThankS

The authors would like to thank the Mercedes-Benz AG staff Harald Behrendt, Dr.-Ing. Josef Steuer, Marc Reichenbacher, Marc Rosenbeck, Choon Ho Lee, and Richard Ziehe. Special thanks go to Steve Adam from Tracetronic.

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Authors and Affiliations

  1. Mercedes-Benz, Sindelfingen, Germany

    Carsten Karthaus & Falko Hanke

  2. Mercedes-Benz, Stuttgart, Germany

    Alexander Bick

  3. Mercedes-Benz, Untertürkheim, Germany

    Brian Douglas

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  1. Carsten Karthaus
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  2. Alexander Bick
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  3. Brian Douglas
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  4. Falko Hanke
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Karthaus, C., Bick, A., Douglas, B. et al. X-in-the-Loop - A Universal Testing Methodology. ATZ Electron Worldw 16, 46–51 (2021). https://doi.org/10.1007/s38314-021-0693-9

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  • DOI: https://doi.org/10.1007/s38314-021-0693-9

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