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Brückmann, H., Waiss, A., Stix, M. et al. Continuous, Platform-independent Testing of Functional Requirements. ATZ Electron Worldw 14, 34–37 (2019). https://doi.org/10.1007/s38314-018-0090-1
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DOI: https://doi.org/10.1007/s38314-018-0090-1