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Fail-operational E/E Architecture for Highly-automated Driving Functions

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Weiß, G., Schleiß, P. & Drabek, C. Fail-operational E/E Architecture for Highly-automated Driving Functions. ATZ Elektron Worldw 11, 16–21 (2016). https://doi.org/10.1007/s38314-016-0032-8

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  • DOI: https://doi.org/10.1007/s38314-016-0032-8