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Denk, M., Lochner, M. Neues Verfahren Echtzeit-Temperaturmessung von Halbleitern. ATZ Elektron 13, 32–37 (2018). https://doi.org/10.1007/s35658-018-0021-1
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DOI: https://doi.org/10.1007/s35658-018-0021-1