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Miegler, M., Ritzer, M. Intelligente HiL-Prüfstände im Entwicklungsprozess. ATZ Elektron 10, 48–53 (2015). https://doi.org/10.1007/s35658-015-0618-6
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DOI: https://doi.org/10.1007/s35658-015-0618-6